News
A JEOL JSM-7500F scanning electron microscope will be coming to CAM in Fall, 2008. The new SEM is designed especially for the ultrahigh resolution imaging needs of nanotechnology research. In addition, the advanced imaging capabilities will greatly facilitate research in many diverse disciplines at MSU.
The new SEM is capable of providing excellent images at magnifications up to 1,000,000X, as shown with two samples from MSU researchers.
Example Images from the JEOL JSM-7500F SEM
Exfoliated graphite with nanoparticles, 1,000,000X.
Fullerene (Buckyball) colloids, 1,000,000X.